Detalls del llibre
Ion scattering spectrometry, a powerful analytical tool used to determine the structure and composition of a substance, addresses critical problems in semiconductors, thin film growth, coatings, computer chips, magnetic storage devices, bioreactive surfaces, catalytic surfaces, and electrochemical surfaces (including the large battery industry).
Llegir més - Autor/a J. Wayne (University Of Houston) Rabalais
- ISBN13 9780471202776
- ISBN10 0471202770
- Pàgines 336
- Any Edició 2002
- Fecha de publicación 29/10/2002
- Idioma Alemany, Francès
Ressenyes i valoracions
Principles and Applications of Ion Scattering Spectrometry: Surface Chemical and Structural Analysis (Alemany, Francès)
- De
- J. Wayne (University Of Houston) Rabalais
- |
- John Wiley (2002)
- 9780471202776



