Detalls del llibre
This is essential reading for semiconductor professionals seeking to expand their knowledge on silicon processes, understand defect prevention, and explore optimizing processes by reducing defects using AI and IoT technologies. It charts a course where semiconductor manufacturing defects are minimized and maximizes productivity.
- Autor/a Rupal Jain
- ISBN13 9788770046817
- ISBN10 8770046816
- Pàgines 138
- Any Edició 2024
- Fecha de publicación 01/09/2024
Ressenyes i valoracions
Advancements in AI and IoT for Chip Manufacturing and Defect Prevention
- De
- Rupal Jain
- 9788770046817



